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Differential Waveform Measurement Circuit for Electron Beam Testers

IP.com Disclosure Number: IPCOM000035383D
Original Publication Date: 1989-Jul-01
Included in the Prior Art Database: 2005-Jan-28

Publishing Venue

IBM

Related People

Authors:
Jenkins, KA [+details]

Abstract

A technique is described whereby electron beam testing equipment circuitry is modified to be able to measure the true differential of two waveforms. The concept is particularly applicable where the difference between the signals of two adjacent circuit lines require measurement, such as the voltage measurements of sense amplifier input circuits.