Testability Design for Collector DOT Circuits
Original Publication Date: 1989-Jul-01
Included in the Prior Art Database: 2005-Jan-28
A method has been proposed for locating and analyzing faults/defects in integrated circuit chips which will be especially useful during the initial development and qualification of new, integrated circuit semiconductor devices. The proposal provides external control for previously inaccessible logic points so as to make the faults testable.