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Test Generation of AC Faults Using Weighted Random Patterns

IP.com Disclosure Number: IPCOM000035689D
Original Publication Date: 1989-Aug-01
Included in the Prior Art Database: 2005-Jan-28

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Forlenza, DO Motika, F Waicukauski, JA Ngo, NN [+details]


Weighted Random Patterns (WRP) test methodology is employed in this article to create an extremely efficient test for AC defects in all combinational and LSSD designs. The particular test methodology is explained at length in 1, but a very cost-effective algorithm is here developed around the procedure in the reference and fault simulation that will reduce the number of WRP patterns necessary to catch all of the AC faults, with significant savings in data definition and test time over previous methods.