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Electron-Beam Injected Current Testing Disclosure Number: IPCOM000035710D
Original Publication Date: 1989-Aug-01
Included in the Prior Art Database: 2005-Jan-28

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Lukianoff, GV [+details]


The techniques described provide a method of testing chips, substrates, and modules, using multiple electron-beam instrumentation. Testing possibilities are: line conductor continuity, linear resistance, introduction of AC currents, and contactless circuit current excitation.