Browse Prior Art Database

Electron-Beam Injected Current Testing

IP.com Disclosure Number: IPCOM000035710D
Original Publication Date: 1989-Aug-01
Included in the Prior Art Database: 2005-Jan-28

Publishing Venue

IBM

Related People

Authors:
Lukianoff, GV [+details]

Abstract

The techniques described provide a method of testing chips, substrates, and modules, using multiple electron-beam instrumentation. Testing possibilities are: line conductor continuity, linear resistance, introduction of AC currents, and contactless circuit current excitation.