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Lateral Forces and Topography Using the Scanning Tunneling Microscope and Optical Sensing of the Tip Position

IP.com Disclosure Number: IPCOM000035783D
Original Publication Date: 1989-Aug-01
Included in the Prior Art Database: 2005-Jan-28

Publishing Venue

IBM

Related People

Authors:
Taubenblatt, MA [+details]

Abstract

A technique is disclosed for measurement of the lateral forces on a Scanning Tunneling Microscope (STM) tip simultaneously with a measurement of surface topography, by using optical sensing of the STM tip vibration.