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Transition Detection Control Subsystem for the Functional Self-Test Chip Prototype

IP.com Disclosure Number: IPCOM000035825D
Original Publication Date: 1989-Aug-01
Included in the Prior Art Database: 2005-Jan-28

Publishing Venue

IBM

Related People

Authors:
Chan, GK O'Dell, JT [+details]

Abstract

The control system described in this article serves to control the transition detection (XDET) data acquisition mode designed for the functional self test chip (FSTC) prototype.