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Card Functional Self-Test Diagnostic Method

IP.com Disclosure Number: IPCOM000035839D
Original Publication Date: 1989-Aug-01
Included in the Prior Art Database: 2005-Jan-28

Publishing Venue

IBM

Related People

Authors:
O'Dell, JT Stenack, WA [+details]

Abstract

The functional self-test (FST) diagnostic method described in this article provides an effective means of functional diagnosis of populated cards. This method eliminates the need for unique diagnostic tester development for each product card.