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Method of Identifying Non-Repairable Fail Patterns Disclosure Number: IPCOM000035850D
Original Publication Date: 1989-Aug-01
Included in the Prior Art Database: 2005-Jan-28

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Dewar, DR [+details]


Random-access memory (RAM) arrays having a finite number of redundant lines in each of two dimensions are tested, and the location of failing cells (fails) is stored. Unfixable distributions of fails are identified early in repair calculations, thus saving calculation and test time.