Browse Prior Art Database

Functional Self-Test Prototype Chip Control System

IP.com Disclosure Number: IPCOM000035851D
Original Publication Date: 1989-Aug-01
Included in the Prior Art Database: 2005-Jan-28

Publishing Venue

IBM

Related People

Authors:
Chan, GK Leasure, TL O'Dell, JT [+details]

Abstract

This article describes the register based control system for the functional self test (FST) prototype chip.