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Arrangement for More Accurately Measuring WI Noise Disclosure Number: IPCOM000036019D
Original Publication Date: 1989-Aug-01
Included in the Prior Art Database: 2005-Jan-28

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Klink, E Knott, P Stahl, R Schaefer, W [+details]


The electrical limits of single and multi-chip modules are presently determined by the WI noise. This is an inductive voltage drop on the chip and substrate wiring which is caused by many off-chip driver transistors (up to 100) or on-chip logic means (1000 to 2000 SR latches) switching simultaneously. (Image Omitted)