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Improved Off-Chip-Driver Sequencer for LSSD Testing

IP.com Disclosure Number: IPCOM000036234D
Original Publication Date: 1989-Sep-01
Included in the Prior Art Database: 2005-Jan-28

Publishing Venue

IBM

Related People

Authors:
Wissel, L [+details]

Abstract

A circuit is shown which utilizes additional FET switches and low resistance wiring to create a fast shut-off control signal for LSSD testing of semiconductor circuits resulting in improved test time.