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Performance Self-Test for High Performance Random-Access Memories

IP.com Disclosure Number: IPCOM000036240D
Original Publication Date: 1989-Sep-01
Included in the Prior Art Database: 2005-Jan-28

Publishing Venue

IBM

Related People

Authors:
Beilstein, KE Gabric, JA Kalter, HL [+details]

Abstract

This article relates to accurate performance testing of high performance random-access memories (SRAM and also DRAM used in static column mode) while minimizing tester accuracy requirements.