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High/Low Temperature Measurement Probe

IP.com Disclosure Number: IPCOM000036297D
Original Publication Date: 1989-Sep-01
Included in the Prior Art Database: 2005-Jan-28

Publishing Venue

IBM

Related People

Authors:
Brady, MJ Davidson, A Santhanam, P Palevski, A [+details]

Abstract

The characterization and understanding of the behavior of high temperature superconductors, e.g., Yttrium Barium Copper Oxide, in a wide temperature range is an important technological task. Proper annealing of these materials at high temperatures (800oC) may be extremely crucial for obtaining good quality samples, as indicated by high superconducting transition temperature and low electrical resistivity. A measurement probe is described that can be used to accomplish the electrical measurements from 1000oK to 100oK. This probe provides good ohmic and non-oxidizing contacts, and has good thermal stability with respect to inherent thermal expansion and contraction. It can be used with thin films or pellet samples, and can do simultaneous resistance and Hall measurements with relatively high accuracy.