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Algorithm for Flexible Decision Processing During Test Generation Disclosure Number: IPCOM000036357D
Original Publication Date: 1989-Sep-01
Included in the Prior Art Database: 2005-Jan-28

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Shearon, PC [+details]


A method implemented in a test generation computer program for making and remaking decisions during circuit test propagation (fanout) which require different decision information than decisions made and remade during block processing (test, justify, and transmit). The method also allows for introducing new block functions which require additional new decision information. (Image Omitted)