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Ce Controlling Chip Scan Strings for Self-Test, LSSD and Debug Tests Disclosure Number: IPCOM000036426D
Original Publication Date: 1989-Sep-01
Included in the Prior Art Database: 2005-Jan-29

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Related People

Jaber, TK [+details]


This article describes a piece of logic that allows the control of various chip scan string configurations to be consolidated into an n- bit multiplexing logic, where n is the number of chip scan strings. (Image Omitted) (Image Omitted) Background