Enhanced RAM Test Method Using Power-On Reset in Non-Volatile Memory
Original Publication Date: 1989-Oct-01
Included in the Prior Art Database: 2005-Jan-29
Disclosed is a method to test different addresses of a RAM using a Power-On Reset (POR) counter in non-volatile memory. All addresses of a RAM can be tested in N times by sampling test with the same quality as normal RAM read/write test.