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Method for Identifying Test Patterns Which Cause Damaging Transient Currents Through Devices Under Test

IP.com Disclosure Number: IPCOM000036494D
Original Publication Date: 1989-Oct-01
Included in the Prior Art Database: 2005-Jan-29

Publishing Venue

IBM

Related People

Authors:
Ferro, E Percy, D VanHorn, J [+details]

Abstract

A small resistor placed in the high voltage supply (Vdd) line to a device under test can, together with the tester's high speed comparators, be used to monitor the voltage across the resistor and identify test patterns that generate high current (1-7 amperes), short time duration (1-15 nanoseconds) transients.