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Thermal Conductivity Measurement of THIN Films

IP.com Disclosure Number: IPCOM000037127D
Original Publication Date: 1989-Nov-01
Included in the Prior Art Database: 2005-Jan-29

Publishing Venue

IBM

Related People

Authors:
Shieh, HD [+details]

Abstract

Described is a method to measure the thermal conductivity of thin films using a magneto-optical (MO) thin film with a known Curie temperature as a sensor. The thermal conductivity of a thin film can be derived by iterating thermal profile calculations using parameters obtained by locally laser heating a MO/THIN FILM sample up to Curie temperature.