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Full-Wafer Testing of Laser Diodes

IP.com Disclosure Number: IPCOM000037166D
Original Publication Date: 1989-Nov-01
Included in the Prior Art Database: 2005-Jan-29

Publishing Venue

IBM

Related People

Authors:
Voegeli, O [+details]

Abstract

This article describes an arrangement for "on-wafer" testing of the light beam characteristics of laser diodes. A sensor, sensitive to the radiation emitted by the laser, receives not only that segment of the laser beam reaching the sensor directly but also a substantial portion of a beam segment which strikes an etched surface, where it is reflected to reach the sensor indirectly.