Full-Wafer Testing of Laser Diodes
Original Publication Date: 1989-Nov-01
Included in the Prior Art Database: 2005-Jan-29
This article describes an arrangement for "on-wafer" testing of the light beam characteristics of laser diodes. A sensor, sensitive to the radiation emitted by the laser, receives not only that segment of the laser beam reaching the sensor directly but also a substantial portion of a beam segment which strikes an etched surface, where it is reflected to reach the sensor indirectly.