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Multi-Function Ganged Probe/Holder Fixture Disclosure Number: IPCOM000037203D
Original Publication Date: 1989-Nov-01
Included in the Prior Art Database: 2005-Jan-29

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Related People

Blair, EA Coughlin, CP Davies, PJ Hodge, PB [+details]


A technique is described whereby a ganged probe/holder fixture combines manufacturing operations, so as to eliminate multiple tooling set-up procedures in the fabrication of probes and holders. A typical probe/ holder is used in testing integrated circuit modules.