Analog/Digital Converter Missing Code Test
Original Publication Date: 1989-Nov-01
Included in the Prior Art Database: 2005-Jan-29
By using a digital/analog (D/A) converter as a stimulus and a random- access memory (RAM) to store passing test results as a RAM address, an A/D converter device is go-no-go tested without extensive data analysis. Measurement of response linearity is made without additional testing and minimal additional digital signal processing. Thus, a very large reduction in A/D device testing time and equipment is realized.