Array Coupled to LSSD Scan Mechanism: Scan Array
Original Publication Date: 1989-Dec-01
Included in the Prior Art Database: 2005-Jan-29
LSSD shift register latches (SRLs) may be used in a computer system for testing, diagnosis, debugging, and setting initial states. However, the shifting of information into and out of the scan path takes a good deal of time. To make it useful in the field for testing and diagnostics, and in the laboratory for debugging and testing, the function must be fast.