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Browse Prior Art Database

Liquid Crystal Cell Thickness Measurement

IP.com Disclosure Number: IPCOM000037253D
Original Publication Date: 1989-Dec-01
Included in the Prior Art Database: 2005-Jan-29

Publishing Venue

IBM

Related People

Authors:
Takano, H [+details]

Abstract

A filled twisted nematic liquid crystal cell thickness measurement method which make use of retardation measurement is disclosed.