Browse Prior Art Database

Test Methodology for a Passive Silicon Carrier

IP.com Disclosure Number: IPCOM000037324D
Original Publication Date: 1989-Dec-01
Included in the Prior Art Database: 2005-Jan-29

Publishing Venue

IBM

Related People

Authors:
Ludwig, T Schettler, H Straehle, W Wagner, O [+details]

Abstract

This article describes a test methodology for an integrated circuit package.