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Decrease the Time to Test RAM Array Logic by Using the ECC Design Logic to Find Errors

IP.com Disclosure Number: IPCOM000037355D
Original Publication Date: 1989-Dec-01
Included in the Prior Art Database: 2005-Jan-29

Publishing Venue

IBM

Related People

Authors:
Bare, GT Nolterieke, RP Treu, AR [+details]

Abstract

This article describes a technique for use in a computer system to test the Error Correction Code (ECC) logic first and then perform a simple pattern test of the random-access memory (RAM) array.