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Tip Fabrication for Scanning Tunneling Microscopy

IP.com Disclosure Number: IPCOM000037446D
Original Publication Date: 1989-Jan-01
Included in the Prior Art Database: 2005-Jan-29

Publishing Venue

IBM

Related People

Authors:
Hamers, RJ [+details]

Abstract

An ideal tip can be fabricated for scanning tunneling microscopy by forming the tip of tungsten and plating the tip with other metals or alloys to obtain the desired properties.