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Fast Write Scheme for Memory Test Patterns

IP.com Disclosure Number: IPCOM000037531D
Original Publication Date: 1989-Mar-01
Included in the Prior Art Database: 2005-Jan-29

Publishing Venue

IBM

Related People

Authors:
Lipa, RA Pokorny, WF Williams, T [+details]

Abstract

A fast write method is shown for loading various test patterns into a memory chip or imbedded memory array for functional test purposes.