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Differentiation Technique for Extraction of Thin-Film Dielectric Breakdown Voltage

IP.com Disclosure Number: IPCOM000037551D
Original Publication Date: 1989-Mar-01
Included in the Prior Art Database: 2005-Jan-29

Publishing Venue

IBM

Related People

Authors:
Anderson, RD Bear, MJ [+details]

Abstract

This article describes a fast, reliable and simple technique for measuring dielectric breakdown voltage.