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A Technique for Path Sensitizing During Circuit Testing

IP.com Disclosure Number: IPCOM000037659D
Original Publication Date: 1989-May-01
Included in the Prior Art Database: 2005-Jan-29

Publishing Venue

IBM

Related People

Authors:
Godoy, HC [+details]

Abstract

To test a complex electronic circuit today, it is frequently advisable to begin with a check of a single "block", unit or device that may be embedded in such circuit. The technique to achieve this test begins with assuming a number of ways a failure can occur and the probable results on surrounding components in the circuit. An output path from that block is needed to check these assumptions.