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Method for Monitoring Grain Size for a Metal Substrate Material

IP.com Disclosure Number: IPCOM000037663D
Original Publication Date: 1989-May-01
Included in the Prior Art Database: 2005-Jan-29

Publishing Venue

IBM

Related People

Authors:
Blackwell, KJ [+details]

Abstract

This method enables the detection of defective areas in a web of substrate material which has developed because of substrate overheating or contamination. During the Vacuum Metalization Process, heat generated is removed by the use of a cold drum. Any area of a metal coating which is not in good mechanical contact with the cold drum, therefore, will become hot, causing it to exhibit large grains in those areas. The areas of larger grain size will have a rougher surface than those areas that are kept cooler.