Self Test Method for Secure LSSD Chip
Original Publication Date: 1989-May-01
Included in the Prior Art Database: 2005-Jan-29
There are many built-in self test architectures in use today. Exact logic design of each built-in self test module is dependent on the particular application for which it is used. This article teaches a secure LSSD method which was developed because of special security requirements for a secure self-test strategy.