Browse Prior Art Database

Self Test Method for Secure LSSD Chip Disclosure Number: IPCOM000037675D
Original Publication Date: 1989-May-01
Included in the Prior Art Database: 2005-Jan-29

Publishing Venue


Related People

Boquet, J Doyle, S LeBlanc, JJ [+details]


There are many built-in self test architectures in use today. Exact logic design of each built-in self test module is dependent on the particular application for which it is used. This article teaches a secure LSSD method which was developed because of special security requirements for a secure self-test strategy.