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Self Test Method for Secure LSSD Chip

IP.com Disclosure Number: IPCOM000037675D
Original Publication Date: 1989-May-01
Included in the Prior Art Database: 2005-Jan-29

Publishing Venue

IBM

Related People

Authors:
Boquet, J Doyle, S LeBlanc, JJ [+details]

Abstract

There are many built-in self test architectures in use today. Exact logic design of each built-in self test module is dependent on the particular application for which it is used. This article teaches a secure LSSD method which was developed because of special security requirements for a secure self-test strategy.