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This article describes an improved method of electrically testing decoupling capacitors after terminal metals.
English (United States)
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Decoupling Capacitor Parallel Test Program
This article describes an improved method of electrically testing decoupling
capacitors after terminal metals.
The prior art method for testing decoupling capacitors required 20 separate
tests requiring an average of four second per device. Each device had four
capacitors each of which required five different electrical tests.
The improved method for testing decoupling capacitors requires four
separate tests, rather than 20, reducing electrical test time to an average of 1.6
seconds per device. Under the new method, the four capacitors are connected
in parallel by the test program software. An internal test limits for continuity,
capacitance, dissipation, and leakage are set in the program to simultaneously
check the four capacitors. If the limits are not met, the device is rejected. FIG. 1
illustrates the process flow diagram of the test software.
Grouping the capacitors reduces the overall test time decreasing manpower
and test equipment costs.