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Semiconductor Yield Management System

IP.com Disclosure Number: IPCOM000037794D
Original Publication Date: 1989-Jul-01
Included in the Prior Art Database: 2005-Jan-30

Publishing Venue

IBM

Related People

Authors:
Castrucci, PP DiToro, JW Rosner, RJ Tolley, JH [+details]

Abstract

By automating in-process, non-destructive semiconductor device and wafer inspection, cataloging and analyzing inspection data, and relating the data to yield models; fast yield prediction and process control is achieved. A total manufacturing yield management system comprised of six interconnected measurement, assessment, and feedback control subsystems is described.