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A Method and Apparatus for Measuring Micron and Sub-Micron Beam Sizes

IP.com Disclosure Number: IPCOM000037849D
Original Publication Date: 1989-Jul-01
Included in the Prior Art Database: 2005-Jan-30

Publishing Venue

IBM

Related People

Authors:
Bellar, RJ Bybee, GD Cross, CW Hogan, WK [+details]

Abstract

This publication describes a method for measuring and characterizing micron and sub-micron optical beam sizes used for, but not limited to, optical recording of data on various types of optical media.