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Close Proximity, Concentrated Light, Crack Detection

IP.com Disclosure Number: IPCOM000037992D
Original Publication Date: 1989-Sep-01
Included in the Prior Art Database: 2005-Jan-31

Publishing Venue

IBM

Related People

Authors:
Krol, CM Schumacher, LJ Walker, JL [+details]

Abstract

An inspection technique for pin grid array ceramic substrates enhances the detection of cracks. The technique works in the following fashion.