The following operators can be used to better focus your queries.
( ) , AND, OR, NOT, W/#
? single char wildcard, not at start
* multi char wildcard, not at start
(Cat? OR feline) AND NOT dog?
Cat? W/5 behavior
(Cat? OR feline) AND traits
Cat AND charact*
This guide provides a more detailed description of the syntax that is supported along with examples.
This search box also supports the look-up of an IP.com Digital Signature (also referred to as Fingerprint); enter the 72-, 48-, or 32-character code to retrieve details of the associated file or submission.
Concept Search - What can I type?
For a concept search, you can enter phrases, sentences, or full paragraphs in English. For example, copy and paste the abstract of a patent application or paragraphs from an article.
Concept search eliminates the need for complex Boolean syntax to inform retrieval. Our Semantic Gist engine uses advanced cognitive semantic analysis to extract the meaning of data. This reduces the chances of missing valuable information, that may result from traditional keyword searching.
An inspection technique for pin grid array ceramic substrates enhances the detection of cracks. The technique works in the following fashion.
English (United States)
This text was extracted from a PDF file.
100% of the total text.
Page 1 of 1
Close Proximity, Concentrated Light, Crack Detection
An inspection technique for pin grid array ceramic substrates enhances the
detection of cracks. The technique works in the following fashion.
A pin grid array substrate 1 (Fig. 1) is inserted into an inspection fixture 2. A
concentrated light source 3 (Fig. 2), such as a fiber optics bundle, is inserted
through the bottom of an inspection table 4 such that the concentrated light
source is flush with the top surface of the table. The fixture is then placed
directly over the concentrated light source (Fig. 3).
The light which travels only the distance of the pin head 5 (Fig. 3) remains
concentrated as it passes through the substrate. The surface area directly above
the light source is highly illuminated. The intensity of the light gradually
decreases with increasing radial distance from the center of the light source
creating a shadowing effect. The entire surface of the substrate is inspected
using a microscope at 10x. Cracks are detected between the area of high
illumination and no illumination.