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Offset Voltage Testing of Half-VDD Bit Lines Disclosure Number: IPCOM000038052D
Original Publication Date: 1989-Oct-01
Included in the Prior Art Database: 2005-Jan-31

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Hurst, JA [+details]


Shorted bit lines of the half-VDD sensing design of dynamic random access memory prevents use of usual measurement of signal margin. By attaching transistors to data lines to apply an offset voltage pulse across the sense amplifier, signal margin can be measured accurately.