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Technique for Reducing Personalized Array Soft Errors

IP.com Disclosure Number: IPCOM000038062D
Original Publication Date: 1989-Oct-01
Included in the Prior Art Database: 2005-Jan-31

Publishing Venue

IBM

Related People

Authors:
Chan, YH [+details]

Abstract

A soft error is a random, non-recurring error in a single bit of a memory array caused by alpha particles which create charges that act as leakage current in the memory cell. If the leakage current is high enough, the state of the memory cell is flipped, causing an error. "Qcrit" is defined as the amount of charge required to flip the state of a memory cell.