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Electronic Pin Location Inspection Using a Spirally Shiftable Template

IP.com Disclosure Number: IPCOM000038471D
Original Publication Date: 1987-Jan-01
Included in the Prior Art Database: 2005-Jan-31

Publishing Venue

IBM

Related People

Authors:
Nguyen, MD [+details]

Abstract

In the manufacture of precision parts, where elements of the part must be precisely aligned, it is very desirable that all parts which are in proper alignment be tested acceptable. In one example, modules were being rejected because pin locations were found displaced from their desired position within a superimposed template. In many instances, these modules were acceptable because all pins were displaced in the same way so that the relative spacing between pins was within tolerable limits. This unacceptable rejection rate was reduced by translating the template pattern. If the pattern of pins is contained within any of the translated template patterns, then the module is found acceptable. The overall system is shown in Fig. 1.