Boundary Logic Multi-Chip Module Testing
Original Publication Date: 1987-Mar-01
Included in the Prior Art Database: 2005-Feb-01
Shift register latches (SRLs) which appear on a periphery of a chip mounted on a multi-chip module (MCM) are utilized to test chip-to-chip interconnections. Referring to Figs. 1 and 2, a plurality of chips 10 are mounted on a MCM 12. Each of the chips 10 includes an internal logic circuit 14 and a plurality of SRLs 16 appearing along the periphery of a chip. Additionally, each of the chips 10 is designed so that the internal logic circuit 14 can be electronically isolated from the SRLs 16. As shown in Fig. 2, the SRLs 16 can be coupled together in a scan string in order to facilitate the testing thereof using level sensitive scan (Image Omitted) design (LSSD) techniques. Moreover, each of the chips 10 is tested at the wafer level in order to detect failures within each chip.