Browse Prior Art Database

Localized Contamination Measurement System

IP.com Disclosure Number: IPCOM000038983D
Original Publication Date: 1987-Apr-01
Included in the Prior Art Database: 2005-Feb-01

Publishing Venue

IBM

Related People

Authors:
Von Voss, WD Weindorf, RC [+details]

Abstract

A method is described of extracting and measuring ionic contamination left around and under the small, compact Surface-Mounted Technology (SMT) components after the flux-cleaning/removal process. One of the important considerations for all circuit cards assembled is how well they have been cleaned. If the cards are not cleaned sufficiently, their reliability will be compromised. The small clearances under SMT components makes flux removal/cleaning difficult. Current contaminant measurement equipment utilizes a sizable quantity (>1 liter) of a deionized water and isopropyl alcohol solution to completely submerge an entire circuit card. As the solution dissolves the residual contamination from the card, a very dilute, slightly conductive solution is formed.