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Magnetic Head Test Optimized for Correlation to Performance Disclosure Number: IPCOM000039010D
Original Publication Date: 1987-Apr-01
Included in the Prior Art Database: 2005-Feb-01

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Cunningham, EA [+details]


This test predicts the performance of a head in a file with respect to signal to noise and adjacent track squeeze effects with respect to bit shift failures, and also for failures of missing bits or extra bits relative to channel tuning. In performance modeling related to bit shift failure, there are two dominant system failure modes. First is a low signal-to-noise mode characterized by narrow track widths and low efficiency and resolution. The second failure mode is dominated by adjacent track interference where wide heads cause most of the problem. High head efficiency can be beneficial due to increased signal levels, or detrimental due to wider write widths causing more track squeeze. Low resolution is also detrimental for this case.