New Strategy for Defect Processing for Fixed-Block Devices
Original Publication Date: 1987-May-01
Included in the Prior Art Database: 2005-Feb-01
Disclosed is a new strategy for defect processing in fixed-block devices. It is characterized by employing skip locators in the ID field of the fixed-block device. The skip locators include data identifying the number of defects in the various fields that fall within the sections identified by the ID field and a second group of variables which describe the possible defect-free sections in the data area. The second group of identifiers each identify either the length of a defect-free section of the data field or a count of the number of defects between two defect-free sections, if the number of such defects exceeds one. A preferred implementation allowing for up to three defects per block uses seven different pieces of locator information in the ID field, called LL1, LL2, LL3, L1, L2, L3, and L4.