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Increasing Memory Reliability Through Address Translation and Per Page Bit Swapping

IP.com Disclosure Number: IPCOM000039445D
Original Publication Date: 1987-Jun-01
Included in the Prior Art Database: 2005-Feb-01

Publishing Venue

IBM

Related People

Authors:
Kuhlman, CL Petrillo, RA [+details]

Abstract

Use of high density dynamic RAM in computer systems and subsystems increases the likelihood of a failure in the system or subsystem unless additional circuitry is provided to mask the failures within the dynamic RAM. This does not prevent failures of the dynamic RAM but prevents the failure from being propagated to other parts of the system or subsystem. The failure modes of a dynamic RAM are Module failures. ROW failures. COLUMN failures. Combination ROW and COLUMN failures. SOFT ERRORS. The soft errors have been handled adequately with error correction codes (ECCs) and memory scrubbing algorithms. Module failures have, in the past, been handled by swapping in a spare memory module for the failing module.