Original Publication Date: 1987-Jun-01
Included in the Prior Art Database: 2005-Feb-01
Memory circuit testers are typically special-purpose tester devices which are connected to a general purpose computer as the source of test patterns for carrying out testing operations. The general-purpose computer will load blocks of test pattern words, typically 1,024 words per block, into a local tester memory of the tester. The tester will then sequentially access each of the test pattern words from the local tester memory and will output each consecutive test pattern to a device under test. A problem arises in the excessive time required to load the local tester memory with the blocks of test pattern words from the general- purpose computer.