Accurate Measurement of Propagation Velocity in a Module
Original Publication Date: 1987-Jun-01
Included in the Prior Art Database: 2005-Feb-01
A new measurement technique has been proposed for determining the propagation time of electrical signals in semiconductor modules. The method will serve to minimize errors attendant with other techniques. Propagation time covers only a range of a few picoseconds and may be measured by injecting an external high frequency signal into one end of a module line and then noting the phase shift as it emerges at the other end. It is necessary to connect the two ends of the line to the external source through a set of pads and probes. This may introduce errors in the measurement because of the associated discontinuities and loading effects. In the proposed method a very high frequency sinusoidal signal is generated on a special test chip which is mounted on the module in a normal manner, as shown in the drawing.