New Test Strategy for High Speed Functional Testing
Original Publication Date: 1987-Aug-01
Included in the Prior Art Database: 2005-Feb-01
This article describes an operable approach to high speed VLSI functional testing using an optical space transformer with limited self- testing hardware. Conventional electrical space transformers are rapidly approaching fundamental limits regarding available bandwidth and practical limits regarding crosstalk and density. Higher speed devices on larger chips with smaller I/O pads only aggravate these problems. High speed electrical space transformers are presently available (18 GHz); however, the density does not approach those needed for VLSI. Using an optical space transformer to replace the electrical space transformer for high speed functional test application provides advantages, such as very high bandwidth, low crosstalk, low loss and high density.