Functional Programmable Card Tester
Original Publication Date: 1987-Aug-01
Included in the Prior Art Database: 2005-Feb-01
A method has been devised for testing semiconductor devices which virtually eliminates manual test data creation. The proposed approach uses Correspondence Data Set (CDS) for product hardware description and Service Language Command (SLC) testcases for the test patterns. The new development is a Functional Programmable Card Tester (FPCT), as shown in the drawing. This is a microprocessor-based test tool which permits large-scale integration (LSI) logic and array products to be functionally tested at operating speeds. The hardware provides up to 512 lines to be interfaced to the product under test with each able to be selected individually as a logic signal input, output or bidirectional line or as a power distribution or analog input line.