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Connector With Additional Contacts for Test Probe

IP.com Disclosure Number: IPCOM000040322D
Original Publication Date: 1987-Oct-01
Included in the Prior Art Database: 2005-Feb-02

Publishing Venue

IBM

Related People

Authors:
Gardeski, DF Takayesu, TT Tkazyik, WJ [+details]

Abstract

A connector that is mounted on an enclosure for electronic equipment has a conventional rectangular array of contacts for a corresponding plug. The plug is connected to a multi-conductor cable that carries signals that are sometimes tested by service personnel. Alongside this conventional array of contacts, the connector has a set of test point contacts that a circuit card can be plugged into. The circuit card carries a conventional circuit for testing signals on the multi- conductor cable. Each of the test point contacts is connected to a signal contact of the conventional contact array or to ground. Both the signal contacts and the test contacts are molded into a common housing that is only slightly wider than a connector having only the conventional contact array.