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X-Ray Microscopy Using a Micro-Pipette

IP.com Disclosure Number: IPCOM000040503D
Original Publication Date: 1987-Nov-01
Included in the Prior Art Database: 2005-Feb-02

Publishing Venue

IBM

Related People

Authors:
Batchelder, JS Wickramasinghe, HK Williams, CC [+details]

Abstract

High spatial resolution, X-ray microscopy can be achieved by filtering the X-ray source through a micro-pipette. In the configuration of the transmission system, an X-ray source is filtered by a pipette aperture to a spot on the order of 100 Angstroms across by a specially designed pipette. This pipette is rastered over the sample surface with known positioning techniques. An X-ray detector is then placed under the sample being inspected. The special design of the micro-pipette causes two different phenomena to localize the X-ray flux. For one, above the tip, the glass walls are made thick enough so that the X-rays are absorbed within the walls of the pipette. Near the tip, the angle of the taper is designed so that the X-rays are confined by total external reflection.