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Mapping of Magnetic Fields on a 1000-Angstrom Scale Using a Spring-Tip Technique and Optical Displacement Detection

IP.com Disclosure Number: IPCOM000040514D
Original Publication Date: 1987-Nov-01
Included in the Prior Art Database: 2005-Feb-02

Publishing Venue

IBM

Related People

Authors:
Martin, Y Wickramasinghe, HK Williams, CC [+details]

Abstract

Magnetic fields can be mapped with a resolution of 1000 Angstroms using a spring-tip technique and optical displacement detection. In operation, a spring-tip of magnetic iron is positioned close to the surface of the magnetic material to be examined. A coil at the other end of the tip sends a guided magnetic flux through the tip. The magnetic field generated at the end of the tip interacts with the local magnetic field of the sample, and a resulting force bends the tip, upward or downward, depending on the signs of both fields. A phase- sensitive optical probe accurately measures the position of the spring, relative to a fixed mirror rigidly connected to the spring base. Alternatively, an AC displacement can be generated on the tip by an AC magnetic field and measured with the probe.