Mapping of Magnetic Fields on a 1000-Angstrom Scale Using a Spring-Tip Technique and Optical Displacement Detection
Original Publication Date: 1987-Nov-01
Included in the Prior Art Database: 2005-Feb-02
Magnetic fields can be mapped with a resolution of 1000 Angstroms using a spring-tip technique and optical displacement detection. In operation, a spring-tip of magnetic iron is positioned close to the surface of the magnetic material to be examined. A coil at the other end of the tip sends a guided magnetic flux through the tip. The magnetic field generated at the end of the tip interacts with the local magnetic field of the sample, and a resulting force bends the tip, upward or downward, depending on the signs of both fields. A phase- sensitive optical probe accurately measures the position of the spring, relative to a fixed mirror rigidly connected to the spring base. Alternatively, an AC displacement can be generated on the tip by an AC magnetic field and measured with the probe.